2003

Journal papers

Bret T., Utke I., Bachmann A., Hoffmann P.
In situ control of the focused-electron-beam-induced deposition process
Applied Physics Letters 83#19: 4005-4007 (Nov 2003)

Conference contributions

Bachmann A., Froehly L., Lasser T., Depeursinge C., Lang F.
Nouvelle méthode d’imagerie 3D: interférométrie spectrale multiplexée en longueur d’onde
CMOI, Belfort, France (17-21 Nov 2003) Froehly L., Bachmann A.H., Lasser T., Depeursinge C., Lang F.
Nouvelle méthode d’imagerie 3D: interférométrie spéctracle multiplexée en longueur d’onde
IMVIE Symposium, Strasbourg, France (17 Sep 2003) Serov A., Steenbergen W., de Mul F.F.M., Lasser T.
Quasi-parallel laser Doppler perfusion imaging using a CMOS image sensor
Proceedings of SPIE 5067: 73-84 (Sep 2003) Zeller M., Lasser T., Limberger H.G.
All-fiber mode-locked Pr/Yb-doped upconversion laser
OSA Topical Meetings: Bragg Gratings Photosensitivity and Poling in Glass Waveguides, Monterey, CA, WD3 (2003) Zeller M., Lasser T., Limberger H.G., Mazé G.
UV-induced index changes in Ce-doped and undoped fluoride glass
OSA Topical Meetings: Bragg Gratings Photosensitivity and Poling in Glass Waveguides, Monterey, CA, MD26 (2003) Anhut T., Karamata B., Lasser T., Raymer M.G., Wenke L.
Measurement of scattered light Wigner functions by phase space tomography and implications for parallel OCT
Proceedings of SPIE 4956: 120-128 (Jul 2003) Mitic J., Anhut T., Serov A., Lasser T., Bourquin S.
Real-time optically sectioned wide-field microscopy employing structured light illumination and a CMOS detector
Proceedings of SPIE 4964: 41-49 (Jul 2003)

Invited talks

Lasser T., Anhut T., Serov A., Hassler K., Rao R., Leutenegger M., von Mühlenen A., Chatton R., Hoffmann P.W., Utke I., Popovic R., Besse P.A., Rochas A., Gösch M., Rigler R., Brunner R.
A look into life sciences: more than a side step from industrial inspection?
Proceedings of SPIE 5144: 504-512 (May 2003) Lasser T.
Mécatronique, Microtechnique, Nano- et biotechnologies: De quoi parle-t-on?
Thésame ESIA, Annecy le Vieux, France (20-21 Mar 2003)

Patents

Kempe M., Brunner R., Lasser T.
Scanning optical near field microscope for use with different contrast methods, including phase contrast microscopy, has an improved photo-detector design that improves resolution and imaging of the smallest structures
DE10206020-A1 (28 Aug 2003) Plamann K., Bourquin S., Ducros M., Mitic J., Vuille F., Lasser T., Anhut T.
Optically sectioned image generating method for microscopy imaging apparatus involves combining measured characteristics of signals from respective positions of conjugate image plane to generate optically sectioned image of specimen
WO2003060587-A; WO2003060587-A1 (24 Jul 2003); AU2003205981-A1 (30 Jul 2003); EP1466204-A1 (13 Oct 2004); JP2005515493-W (26 May 2005); US2005117172-A1 (02 Jun 2005)